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Lytvyn P. M. Ultrasonic assisted nanomanipulations with atomic force microscope [Електронний ресурс] / P. M. Lytvyn, O. Ya. Olikh, O. S. Lytvyn, O. M. Dyachyns'ka, I. V. Prokopenko // Semiconductor physics, quantum electronics & optoelectronics. - 2010. - Vol. 13, № 1. - С. 36-42. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2010_13_1_9 Demonstrated experimentally in this work was the possibility of controlled handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor surface by using an atomic force microscope under conditions of acoustic excitation. It has been shown that the selective transport of particles of a certain size is possible owing to the change of an ultrasonic vibration amplitude. Also in this study, possible mechanisms in which ultrasound may influence the particle-surface interaction and the probe-particle (surface) interaction have been analyzed.
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