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Belyaev A. E. Some aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes [Електронний ресурс] / A. E. Belyaev, N. S. Boltovets, R. V. Konakova, Ya. Ya. Kudryk, V. M. Sorokin, V. N. Sheremet, V. V. Shynkarenko // Semiconductor physics, quantum electronics & optoelectronics. - 2011. - Vol. 14, № 4. - С. 465-469. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2011_14_4_19 Some aspects of measuring the thermal resistance to a constant heat flow at a p-n junction - package region in IMPATT and light-emitting diodes are considered. We propose a method of studying the thermal resistance of high-power light-emitting diodes. This method makes it possible to increase accuracy of measuring the thermal resistance by determining the temperature at a linear section of the voltage - temperature curve. A possibility to measure the thermal resistance of IMPATT diodes by using the pulse I-V curves is shown. This enables one to simplify calculations and increase accuracy of measuring the thermal resistance.
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