Cu6PS5I-based thin films were deposited onto silicate glass substrates by non-reactive radio-frequency magnetron sputtering. The chemical composition of thin films was determined using energy-dispersive X-ray spectroscopy. Electrical conductivity of Cu6PS5I-based thin films was studied as dependent on chemical composition. Optical transmission spectra of Cu5,46P1,68S5,06I0,80 thin film were investigated within the temperature interval 77...300 K; temperature behaviour of optical absorption spectra and dispersion of the refractive index were also studied. Temperature dependences of the energy position of absorption edge, Urbach energy and refractive index of Cu5,46P1,68S5,06I0,80 thin film have been analyzed.

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