The theoretical and experimental investigations of electrical properties of the Al-SiO2-(Si - ncs)-SiO2-Si structures grown using high temperature annealing SiOx, <$E x~<<~2>, have been carried out. It has been experimentally found that the Al-SiO2-(Si - ncs)-SiO2-Si structures with the tunnel dielectric layer revealed the effect of dynamic memory. Electric properties and parameters of the interface states located between Si - ncs and SiO2 were studied in detail by measuring of current-voltage, capacitance-voltage, and thermally stimulated current characteristics.

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