Results of a precise calculation of X-ray diffraction on distorted edge-dislocation neighborhood in crystals are represented. Calculation of lattice sums of diffraction has been carried out with adherence to the classical scheme. So unlike to the previous approach, finite-differential distances of atomic pairs of diffraction were immediately taken into account here. The statistical form of their representation was used. Obtained results are compared with previous those based on identification of X-ray profiles with statistical strain distribution. It was found that accuracy of the previous result is sufficient for analyses of the dislocation structure with moderate inhomogeneity.

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