(Ag3AsS3)0,6(As2S3)0,4 thin films were deposited upon a quartz substrate by rapid thermal evaporation at temperatures 1050, 1200, and 1350 C. Structural studies of the as-deposited thin films were carried out by scanning electron microscopy and atomic force microscopy. It is shown that the surfaces of all the films were covered with Ag-rich crystalline micrometer sized cones. The optical transmission spectra for as-deposited thin films were studied at room temperature. The absorption spectra in the region of its exponential behaviour were analyzed, the dispersion dependences of refractive index as well as their variation depending on evaporation temperature were investigated.Cu5,5P1,2Se5,0I1,3 thin film was deposited onto silicate glass substrate by nonreactive radio frequency magnetron sputtering. Structural studies were carried out using X-ray diffraction and SEM techniques. Spectrometric studies of transmission spectra of Cu5,5P1,2Se5,0I1,3 thin film in the temperature interval 77 to 300 К were investigated. It is shown that the temperature behaviour of optical absorption edge is described by the Urbach rule. Temperature dependences of optical parameters of the Urbach absorption edge and refractive index have been analyzed. The influence of temperature and structural disordering on the Urbach tail has been studied. The comparison of optical parameters of Cu6PSe5I crystal and Cu5,5P1,2Se5,0I1,3 thin film has been performed.

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